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Thomas W. Williams (engineer)

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170:, as well as the co-founder of the European workshop on design for testability. Williams chaired the IEEE technical subcommittee on design for testability and has been a keynote and invited speaker at international conferences. Williams was honored as a Distinguished Visiting Speaker by the IEEE Computer Society from 1982 to 1985. He served as a special-issue editor for the 216:
In 2007, Williams received the European Design and Automation Association (EDAA) Lifetime Achievement Award for outstanding contributions to the state of the art in electronic design, automation and testing of electronic systems. This award was presented during the opening session of the
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Williams coauthored four books, 50 refereed publications and 20 patents. He received the following Outstanding Paper Awards:
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of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts.”
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in 1989 from the IEEE International Test Conference for work on AC test quality (with U. Park and M. R. Mercer),
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In 2010, Williams was the recipient of the IEEE Test Technology Technical Council Lifetime Contribution Medal.
171: 148: 488: 260: 513: 210: 111:. He is known for his contributions to electronic design, automation and testing of electronic systems. 508: 206: 140: 73: 324: 59: 390: 346: 199: 195: 167: 136: 120: 96: 364: 283: 203: 163: 518: 187: 77: 8: 124: 55: 232: 152: 302: 284:"Synopsys Fellow Dr. Thomas W. Williams to Receive EDAA Lifetime Achievement Award" 128: 68: 236: 107:(born August 3, 1943) was an American engineer, Chief Scientist and fellow at 482: 176:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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for work on synthesis and testing (with B. Underwood and M. R. Mercer).
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in 1987 from the IEEE International Test Conference for work on
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self-testing (with W. Daehn, M. Gruetzner, and C. W. Starke),
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in 1988 “for leadership and contributions to the area of
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and his overall impact on the electronics industry".
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in 1987 from the CompEuro’87 for work on self-test,
192:Institute of Electrical and Electronics Engineers 480: 159:where he became a fellow and Chief Scientist. 413:"2018 ESD Alliance / CEDA Phil Kaufman Award" 181: 297: 295: 293: 278: 276: 162:Williams was the founder and chair of the 133:State University of New York at Binghamton 65:State University of New York at Binghamton 405: 119:Williams obtained a bachelor's degree in 365:"IEEE TTTC Lifetime Contribution Medal" 290: 273: 114: 481: 430: 235:"for his outstanding contributions to 388: 219:Design Automation and Test in Europe 504:Electronic design automation people 351:IEEE Design & Test of Computers 317: 13: 303:"Thomas Williams, Award Recipient" 14: 530: 462: 445:Electronic System Design Alliance 417:Electronic System Design Alliance 229:Electronic System Design Alliance 198:.” In 1989 Williams shared with 143:. He worked as a manager of the 391:"Tom Williams Wins TTTC Award" 382: 357: 339: 211:level-sensitive scan technique 172:IEEE Transactions on Computers 1: 494:American electrical engineers 267: 149:IBM Microelectronics Division 147:for Testability group at the 16:American engineer (born 1943) 499:American computer scientists 261:Design Automation Conference 7: 389:Ward, Bob (February 2011). 10: 535: 259:in 1991 from the ACM/IEEE 231:honored Williams with the 182:Awards and accomplishments 207:W. Wallace McDowell Award 141:Colorado State University 92: 84: 74:Colorado State University 51: 28: 21: 353:: 200. March–April 2007. 305:. IEEE Computer Society 286:. Synopsys. April 2007. 127:, a master's degree in 200:Edward B. Eichelberger 196:design for testability 168:design for testability 137:electrical engineering 121:electrical engineering 97:design for testability 88:Scientist and engineer 204:IEEE Computer Society 186:Williams was named a 164:IEEE Computer Society 209:“for developing the 115:Education and career 489:Fellows of the IEEE 475:Bibliography Server 325:"Fellows directory" 125:Clarkson University 56:Clarkson University 514:American inventors 469:Thomas W. Williams 233:Phil Kaufman Award 105:Thomas W. Williams 33:Thomas W. Williams 23:Thomas W. Williams 509:Technical writers 447:. August 28, 2018 155:. He then joined 153:Boulder, Colorado 135:, and a Ph.D. in 102: 101: 526: 457: 456: 454: 452: 442: 434: 428: 427: 425: 423: 409: 403: 402: 386: 380: 379: 377: 375: 361: 355: 354: 343: 337: 336: 334: 332: 321: 315: 314: 312: 310: 299: 288: 287: 280: 129:pure mathematics 42: 40: 19: 18: 534: 533: 529: 528: 527: 525: 524: 523: 479: 478: 465: 460: 450: 448: 440: 436: 435: 431: 421: 419: 411: 410: 406: 387: 383: 373: 371: 363: 362: 358: 345: 344: 340: 330: 328: 323: 322: 318: 308: 306: 301: 300: 291: 282: 281: 274: 270: 237:test automation 184: 117: 72: 63: 47: 44: 38: 36: 35: 34: 24: 17: 12: 11: 5: 532: 522: 521: 516: 511: 506: 501: 496: 491: 477: 476: 464: 463:External links 461: 459: 458: 429: 404: 381: 356: 338: 316: 289: 271: 269: 266: 265: 264: 257: 254: 251: 183: 180: 116: 113: 100: 99: 94: 93:Known for 90: 89: 86: 82: 81: 53: 49: 48: 45: 43:August 3, 1943 32: 30: 26: 25: 22: 15: 9: 6: 4: 3: 2: 531: 520: 517: 515: 512: 510: 507: 505: 502: 500: 497: 495: 492: 490: 487: 486: 484: 474: 470: 467: 466: 446: 439: 433: 418: 414: 408: 400: 396: 395:IEEE Computer 392: 385: 370: 369:ieee-tttc.org 366: 360: 352: 348: 342: 326: 320: 304: 298: 296: 294: 285: 279: 277: 272: 262: 258: 255: 252: 249: 245: 244: 243: 240: 238: 234: 230: 227:In 2018, the 225: 222: 220: 214: 212: 208: 205: 201: 197: 193: 189: 179: 177: 173: 169: 165: 160: 158: 154: 150: 146: 142: 138: 134: 130: 126: 122: 112: 110: 106: 98: 95: 91: 87: 85:Occupation(s) 83: 79: 75: 70: 66: 61: 57: 54: 50: 31: 27: 20: 449:. Retrieved 444: 432: 420:. Retrieved 416: 407: 398: 394: 384: 372:. Retrieved 368: 359: 350: 341: 329:. Retrieved 319: 307:. Retrieved 241: 226: 223: 221:conference. 215: 185: 166:workshop on 161: 118: 104: 103: 519:1943 births 401:(2): 74–76. 145:VLSI Design 483:Categories 374:August 23, 309:August 22, 268:References 39:1943-08-03 202:the 1989 131:from the 52:Education 451:6 August 422:6 August 331:July 30, 174:and the 157:Synopsys 109:Synopsys 190:of the 327:. IEEE 188:fellow 441:(PDF) 139:from 123:from 69:BA.Ma 473:DBLP 453:2023 424:2023 376:2023 333:2023 311:2023 248:VLSI 78:PhD. 46:U.S. 29:Born 471:at 151:in 60:BSE 485:: 443:. 415:. 399:44 397:. 393:. 367:. 349:. 292:^ 275:^ 178:. 455:. 426:. 378:. 335:. 313:. 80:) 76:( 71:) 67:( 62:) 58:( 41:) 37:(

Index

Clarkson University
BSE
State University of New York at Binghamton
BA.Ma
Colorado State University
PhD.
design for testability
Synopsys
electrical engineering
Clarkson University
pure mathematics
State University of New York at Binghamton
electrical engineering
Colorado State University
VLSI Design
IBM Microelectronics Division
Boulder, Colorado
Synopsys
IEEE Computer Society
design for testability
IEEE Transactions on Computers
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
fellow
Institute of Electrical and Electronics Engineers
design for testability
Edward B. Eichelberger
IEEE Computer Society
W. Wallace McDowell Award
level-sensitive scan technique
Design Automation and Test in Europe

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