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from 1956 until 1994. He received 25 patents. Among his remarkable contributions was a 1965 paper on hazard detection in combinational and sequential circuits. In 1973, he was honored by the IBM Outstanding
Contribution Award for the
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technique of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts.” In 2000, Eichelberger received the IEEE Test
Technology Technical Council's Lifetime Contribution Medal.
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Waicukauski, John A.; Lindbloom, Eric; Eichelberger, Edward B.; Forlenza, Orazio P. (1989). "A Method for
Generating Weighted Random Test Patterns".
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Eichelberger, Edward B.; Lindbloom, Eric (1983). "Random-Pattern
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Eichelberger, Edward B. (1965). "Hazard
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