Knowledge

Electron-beam physical vapor deposition

Source 📝

80: 134:
energy through interactions with the evaporation material. The thermal energy that is produced heats up the evaporation material causing it to melt or sublimate. Once temperature and vacuum level are sufficiently high, vapor will result from the melt or solid. The resulting vapor can then be used to coat surfaces. Accelerating voltages can be between 3 and 40 kV. When the accelerating voltage is 20–25 kV and the beam current is a few
64:(CVD). In CVD, the film growth takes place at high temperatures, leading to the formation of corrosive gaseous products, and it may leave impurities in the film. The PVD process can be carried out at lower deposition temperatures and without corrosive products, but deposition rates are typically lower. 232:
may be employed to reduce diffusion lifetime, positively bolstering surface kinetic barriers. To further enhance film roughness, the substrate may be mounted at a steep angle with respect to the flux to achieve geometric shadowing, where incoming line of sight flux lands onto only higher parts of the
55:
industry to form thermal and chemical barrier coatings to protect surfaces against corrosive environments, in optics to impart the desired reflective and transmissive properties to a substrate and elsewhere in industry to modify surfaces to have a variety of desired properties. The deposition process
311:
EBPVD is a line-of-sight deposition process when performed at a low enough pressure (roughly <10 Torr ). The translational and rotational motion of the shaft helps for coating the outer surface of complex geometries, but this process cannot be used to coat the inner surface of complex geometries.
133:
or the anodic arc method. The generated electron beam is accelerated to a high kinetic energy and directed towards the evaporation material. Upon striking the evaporation material, the electrons will lose their energy very rapidly. The kinetic energy of the electrons is converted into other forms of
31:
is bombarded with an electron beam given off by a charged tungsten filament under high vacuum. The electron beam causes atoms from the target to transform into the gaseous phase. These atoms then precipitate into solid form, coating everything in the vacuum chamber (within line of sight) with a thin
282:
The deposition rate in this process can be as low as 1 nm per minute to as high as few micrometers per minute. The material utilization efficiency is high relative to other methods, and the process offers structural and morphological control of films. Due to the very high deposition rate, this
257:
of the substrate. The ion beams bombard the surface and alter the microstructure of the film. When the deposition reaction takes place on the hot substrate surface, the films can develop an internal tensile stress due to the mismatch in the coefficient of thermal expansion between the substrate and
141:
There are three main EBPVD configurations, electromagnetic alignment, electromagnetic focusing and the pendant drop configuration. Electromagnetic alignment and electromagnetic focusing use evaporation material that is in the form of an ingot, while the pendant drop configuration uses a rod. Ingots
218:
The substrate on which the film deposition takes place is ultrasonically cleaned and fastened to the substrate holder. The substrate holder is attached to the manipulator shaft. The manipulator shaft moves translationally to adjust the distance between the ingot source and the substrate. The shaft
83:
Fig 1. Electromagnetic alignment. The ingot is held at a positive potential relative to the filament. To avoid chemical interactions between the filament and the ingot material, the filament is kept out of sight. A magnetic field is employed to direct the electron beam from its source to the ingot
169:
and zirconium boride can evaporate without undergoing decomposition in the vapor phase. These compounds are deposited by direct evaporation. In this process these compounds, compacted in the form of an ingot, are evaporated in vacuum by the focused high-energy electron beam, and the vapors are
319:
10 hPa) or higher, significant scattering of the vapor cloud takes place such that surfaces not in sight of the source can be coated. Strictly speaking, the slow transition from line-of-sight to scattered deposition is determined not only by pressure (or mean free path) but also by
125:, for situations such as parallel use with magnetron sputtering. Multiple types of evaporation materials and electron guns can be used simultaneously in a single EBPVD system, each having a power from tens to hundreds of kilowatts. Electron beams can be generated by 519:
Driskell, Jeremy D.; Shanmukh, Saratchandra; Liu, Yongjun; Chaney, Stephen B.; Tang, X.-J.; Zhao, Y.-P.; Dluhy, Richard A. (2008). "The Use of Aligned Silver Nanorod Arrays Prepared by Oblique Angle Deposition as Surface Enhanced Raman Scattering Substrates".
210:. Each ingot is heated with a different beam energy so that their evaporation rate can be controlled. As the vapors arrive at the surface, they chemically combine under proper thermodynamic conditions to form a metal carbide film. 193:
decompose upon heating, and the dissociated elements have different volatilities. These compounds can be deposited on the substrate either by reactive evaporation or by co-evaporation. In the reactive evaporation process, the
223:
of 200–400 V can be applied to the substrate. Often, focused high-energy electrons from one of the electron guns or infrared light from heater lamps is used to preheat the substrate. Heating of the substrate allows increased
150:
circulation. In the case of ingots, molten liquid can form on its surface, which can be kept constant by vertical displacement of the ingot. The evaporation rate may be on the order of 10 g/(cm·s).
202:
in case of metal carbides. When the thermodynamic conditions are met, the vapors react with the gas in the vicinity of the substrate to form films. Metal carbide films can also be deposited by co-
228:–substrate and adatom–film diffusion by giving the adatoms sufficient energy to overcome kinetic barriers. If a rough film, such as metallic nanorods, is desired substrate cooling with water or 138:, 85% of the electron's kinetic energy can be converted into thermal energy. Some of the incident electron energy is lost through the production of X-rays and secondary electron emission. 391: 177:
beam, resulting in a stoichiometry that is different from the initial material. For example, alumina, when evaporated by electron beam, dissociates into aluminum, AlO
562:/TiC and TiC/CrC multilayer coatings by reactive and ion beam assisted, electron beam-physical vapor deposition (EB-PVD) The Pennsylvania State University, 1996. 323:
Certain materials are not well-suited to evaporation by EBPVD. The following reference materials suggest appropriate evaporation techniques for many materials:
330: 146:
crucible or hearth, while a rod will be mounted at one end in a socket. Both the crucible and socket must be cooled. This is typically done by
76:
at relatively low substrate temperatures, with very high material utilization efficiency. The schematic of an EBPVD system is shown in Fig 1.
198:
is evaporated from the ingot by the electron beam. The vapors are carried by the reactive gas, which is oxygen in case of metal oxides or
387: 117:
or rod. Alternatively, some modern EBPVD systems utilize an arc-suppression system and can be operated at vacuum levels as low as 5.0
425:
Kesapragada, S. V.; Victor, P.; Nalamasu, O.; Gall, D. (2006). "Nanospring Pressure Sensors Grown by Glancing Angle Deposition".
219:
also rotates the substrate at a particular speed so that the film is uniformly deposited on the substrate. A negative bias DC
476:
Robbie, K.; Brett, M. J. (1997). "Sculptured thin films and glancing angle deposition: Growth mechanics and applications".
312:
Another potential problem is that filament degradation in the electron gun results in a non-uniform evaporation rate.
415:
Madou, M. J., "Fundamentals of Microfabrication: The science of Miniaturization" 2nd Ed., CRC Press (2002), p. 135–6.
84:
location. An additional electric field can be used to steer the beam over the ingot surface allowing uniform heating.
44: 378:
Harsha, K. S. S, "Principles of Physical Vapor Deposition of Thin Films", Elsevier, Great Britain (2006), p. 400.
339: 270:. Ion bombardment also increases the density of the film, changes the grain size and modifies amorphous films to 640: 233:
developing film. This method is known as glancing-angle deposition (GLAD) or oblique-angle deposition (OAD).
327: 347: 246: 61: 57: 24: 618: 588: 359: 388:
http://telemark.com/electron_beam_sources/arc_suppression.php?cat=1&id=Arc+Suppression+Sources
288: 259: 130: 635: 558:
D. Wolfe, Thesis (Ph.D), Thesis 2001dWolfe,DE, Synthesis and characterization of TiC, TiBCN,TiB
605: 575: 173:
Certain refractory oxides and carbides undergo fragmentation during their evaporation by the
485: 434: 48: 40: 8: 126: 489: 438: 406:
George, J., "Preparation of thin films", Marcel Dekker, Inc., New York (1992), p. 13–19.
267: 537: 501: 458: 450: 529: 493: 442: 190: 68:
physical vapor deposition, however, yields a high deposition rate from 0.1 to 100
395: 334: 271: 229: 186: 315:
However, when vapor deposition is performed at pressures of roughly 10 Torr (1.3
263: 254: 79: 629: 541: 505: 454: 106: 462: 110: 478:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
274:
films. Low-energy ions are used for the surfaces of semiconductor films.
203: 65: 206:. In this process, two ingots are used, one for metal and the other for 250: 158: 533: 446: 497: 303:
films for semiconductor industries and thin-film solar applications.
199: 52: 174: 94: 93:
In an EBPVD system, the deposition chamber must be evacuated to a
300: 292: 220: 162: 135: 258:
the film. High-energy ions can be used to bombard these ceramic
596:
Wolfe, D.; J. Singh (2000). "Surface and Coatings Technology".
225: 207: 166: 143: 73: 424: 195: 147: 114: 28: 113:
to the evaporation material, which can be in the form of an
69: 296: 284: 122: 102: 518: 242: 241:EBPVD systems are equipped with ion sources. These 283:process has potential industrial application for 627: 528:(4). American Chemical Society (ACS): 895–901. 433:(4). American Chemical Society (ACS): 854–857. 236: 153: 88: 566:Movchan, B. A. (2006). "Surface Engineering". 595: 328:Vacuum Engineering & Materials Co., Inc. 475: 291:in aerospace industries, hard coatings for 484:(3). American Vacuum Society: 1460–1465. 109:) to allow passage of electrons from the 170:directly condensed over the substrate. 78: 565: 17:Electron-beam physical vapor deposition 628: 522:The Journal of Physical Chemistry C 13: 348:Evaporation Guide for the Elements 14: 652: 185:O. Some refractory carbides like 306: 299:industries, and electronic and 253:the target and controlling the 245:sources are used for substrate 56:can be broadly classified into 35: 512: 469: 418: 409: 400: 381: 372: 320:source-to-substrate distance. 1: 552: 365: 277: 32:layer of the anode material. 237:Ion-beam-assisted deposition 213: 154:Material evaporation methods 89:Thin-film deposition process 43:is a process applied in the 7: 353: 10: 657: 165:and borides like titanium 62:chemical vapor deposition 58:physical vapor deposition 25:physical vapor deposition 360:Electron-beam technology 289:thermal barrier coatings 260:thermal barrier coatings 161:carbides like titanium 131:field electron emission 613:Cite journal requires 583:Cite journal requires 340:Kurt J. Lesker Company 85: 45:semiconductor industry 82: 641:Thin film deposition 49:electronic materials 41:Thin-film deposition 490:1997JVSTA..15.1460R 439:2006NanoL...6..854K 127:thermionic emission 394:2012-12-12 at the 346:Also see Oxford's 333:2013-05-12 at the 268:compressive stress 142:are enclosed in a 86: 27:in which a target 534:10.1021/jp075288u 447:10.1021/nl060122a 648: 622: 616: 611: 609: 601: 592: 586: 581: 579: 571: 546: 545: 516: 510: 509: 498:10.1116/1.580562 473: 467: 466: 422: 416: 413: 407: 404: 398: 385: 379: 376: 318: 191:tungsten carbide 120: 100: 656: 655: 651: 650: 649: 647: 646: 645: 626: 625: 614: 612: 603: 602: 584: 582: 573: 572: 561: 555: 550: 549: 517: 513: 474: 470: 423: 419: 414: 410: 405: 401: 396:Wayback Machine 386: 382: 377: 373: 368: 356: 335:Wayback Machine 316: 309: 287:-resistant and 280: 272:polycrystalline 262:and change the 239: 230:liquid nitrogen 216: 187:silicon carbide 184: 180: 156: 118: 98: 97:of at least 7.5 91: 38: 23:, is a form of 12: 11: 5: 654: 644: 643: 638: 624: 623: 615:|journal= 593: 585:|journal= 563: 559: 554: 551: 548: 547: 511: 468: 417: 408: 399: 380: 370: 369: 367: 364: 363: 362: 355: 352: 344: 343: 337: 308: 305: 279: 276: 264:tensile stress 255:microstructure 249:and cleaning, 238: 235: 215: 212: 182: 178: 155: 152: 90: 87: 37: 34: 9: 6: 4: 3: 2: 653: 642: 639: 637: 636:Electron beam 634: 633: 631: 620: 607: 599: 594: 590: 577: 569: 564: 557: 556: 543: 539: 535: 531: 527: 523: 515: 507: 503: 499: 495: 491: 487: 483: 479: 472: 464: 460: 456: 452: 448: 444: 440: 436: 432: 428: 421: 412: 403: 397: 393: 389: 384: 375: 371: 361: 358: 357: 351: 349: 341: 338: 336: 332: 329: 326: 325: 324: 321: 313: 307:Disadvantages 304: 302: 298: 294: 290: 286: 275: 273: 269: 265: 261: 256: 252: 248: 244: 234: 231: 227: 222: 211: 209: 205: 201: 197: 192: 188: 176: 171: 168: 164: 160: 151: 149: 145: 139: 137: 132: 128: 124: 116: 112: 108: 104: 96: 81: 77: 75: 71: 67: 66:Electron-beam 63: 59: 54: 50: 46: 42: 33: 30: 26: 22: 18: 606:cite journal 597: 576:cite journal 567: 525: 521: 514: 481: 477: 471: 430: 427:Nano Letters 426: 420: 411: 402: 383: 374: 345: 322: 314: 310: 281: 240: 217: 172: 157: 140: 111:electron gun 92: 39: 36:Introduction 20: 16: 15: 570:(1): 35–46. 204:evaporation 630:Categories 600:: 142–153. 366:References 278:Advantages 251:sputtering 159:Refractory 60:(PVD) and 542:1932-7447 506:0734-2101 455:1530-6984 214:Substrate 200:acetylene 53:aerospace 51:, in the 553:See also 463:16608297 392:Archived 354:See also 331:Archived 175:electron 95:pressure 47:to grow 486:Bibcode 435:Bibcode 301:optical 293:cutting 247:etching 221:voltage 163:carbide 136:amperes 540:  504:  461:  453:  226:adatom 208:carbon 181:and Al 167:boride 144:copper 266:into 196:metal 148:water 115:ingot 29:anode 21:EBPVD 19:, or 619:help 589:help 538:ISSN 502:ISSN 459:PMID 451:ISSN 297:tool 295:and 285:wear 189:and 123:Torr 105:(10 103:Torr 598:124 530:doi 526:112 494:doi 443:doi 243:ion 121:10 101:10 74:min 632:: 610:: 608:}} 604:{{ 580:: 578:}} 574:{{ 568:22 536:. 524:. 500:. 492:. 482:15 480:. 457:. 449:. 441:. 429:. 390:. 350:. 129:, 107:Pa 70:μm 621:) 617:( 591:) 587:( 560:2 544:. 532:: 508:. 496:: 488:: 465:. 445:: 437:: 431:6 342:. 317:× 183:2 179:3 119:× 99:× 72:/

Index

physical vapor deposition
anode
Thin-film deposition
semiconductor industry
electronic materials
aerospace
physical vapor deposition
chemical vapor deposition
Electron-beam
μm
min

pressure
Torr
Pa
electron gun
ingot
Torr
thermionic emission
field electron emission
amperes
copper
water
Refractory
carbide
boride
electron
silicon carbide
tungsten carbide
metal

Text is available under the Creative Commons Attribution-ShareAlike License. Additional terms may apply.