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240:, Dick Hubach recognized a need for automated dimensional measurement systems, when he discovered that the cost to verify the correct manufacture of some aerospace components actually exceeded the cost to manufacture those components. This recognition led to a new start-up company named VIEW Engineering.
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Also in 1996, VIEW Engineering was purchased by
General Scanning, Inc. (GSI). Quality Vision International, Inc. (QVI) purchased the company from GSI Lumonics (previously GSI) in 2000. In 2005, QVI combined VIEW Engineering with Micro Metric, Inc. of San Jose, California, and in 2008 renamed the new
24:
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In 1996, Robotic Vision
Systems, Inc. (RVSI) first brought a patent infringement lawsuit against VIEW Engineering related to the coplanarity measurement of packaged semiconductor devices. In 2000, RVSI's patent was finally declared invalid and the U.S. District Court for the Central District of
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Programmable Ring Light hardware to enhance the appearance of weak-edges in video images by controlling illumination intensity, direction, color and angle of incidence. (United States Patent 4706168) (Japan Patent 2001-324450) (China Patent 200810207342) (Canada Patent CA
280:
invested in VIEW Engineering in 1984 as part of its plan to improve automobile manufacturing quality in the U.S. through widespread use of factory floor machine vision technology. In 1989, VIEW Engineering purchased
Synthetic Vision Systems, Inc.
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in the late 1980s. This relationship was concluded when
Mitutoyo licensed VIEW's machine vision technology in 1994. This licensed technology became the foundation for Mitutoyo's video and laser-based CMMs.
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Correlation-based
Pattern Recognition hardware and software to find the position of specific, complex part features in video images. (United States Patent 4200861 & 4736437 & 4385322 & 4300164)
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VIEW Micro-Metrology continues to be global supplier of high-accuracy video coordinate measuring systems and software, primarily serving micro-electronic, mobile device and data storage manufacturing.
247:
in 1976. The next year, VIEW introduced the word's first automated, 3-axis, machine vision-based, dimensional measurement system β the RB-1. The RB-1 was the forerunner of modern machine vision-based
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Triangulation-based 3D Imaging. (United States Patent 5546189 & 5617209) (Korea Patent 1019997000995) (PCT Patent WO 1998/005923 & 1996/034253) (Canada Patent CA 1287486 & CA 1265869)
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and
Precision assembly / fabrication industries. VIEW's systems used video and laser technologies to perform their functions without touching the parts being examined.
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494:
Automatic, Video-based, Camera
Focusing to determine the Z-axis position of an object under inspection. (United States Patent 4920273) (Canada Patent CA 1255796)
196:
systems. These systems provided automated dimensional measurement, defect detection, alignment and quality control capabilities. They were used primarily in the
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672:
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Other VIEW Engineering patents relate to the 3D laser-scanning technology used in VIEW's PGA, QFP, TQFP, TSOP and BGA package inspection systems
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Ronchi Grid
Surface Focus hardware to allow automatic camera-focusing on reflective or low-texture surfaces. (United States Patent 4743771)
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1982: VIEW 1101 β A 2nd generation, binary image, pattern recognition system for automated
Wirebonding machines and Wafer probers
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California ruled in favor of VIEW Engineering. Even after this ruling, RVSI contemplated continuing its appeals through 2001.
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VIEW Engineering's patents related to correlation-based pattern recognition were the foundation of the company's beginnings
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1982: VIEW 1119 β A combination of the 719 and the 1101 that provided pattern recognition and edge detection capabilities
301:
company "VIEW Micro-Metrology." In 2009, VIEW's
California operations were relocated to QVI's Western Region facility in
716:
483:
A number of VIEW Engineering's 31 patents address key video technologies useful in machine vision-based CMMs including
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44:
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1978: VIEW PR-1 β A binary image, pattern recognition system for automated Wirebonding machines and Wafer probers
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154:
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48:
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361:, machine vision-based, dimensional measurement system (a forerunner of modern machine vision-based CMMs)
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628:
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2001: VIEW Summit 450 & Summit 600 β High-accuracy, large-travel, machine vision-based CMMs
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34:
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1990: VIEW 7100 β A 2nd generation, machine vision system for QFP and PLCC package inspection
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1981: VIEW 719 β A general-purpose, binary image, machine vision system for shop floor use
8:
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251:(CMMs). This was followed in 1978 by the introduction of the first pattern recognition (
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1995: VIEW 880 β A laser-based, 3D scanner system for in-tray inspection of QFP, TQFP (
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1993: VIEW Voyager 6x12, Voyager 12x12 & Voyager 18x18 β Machine vision-based CMMs
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As the company's business increased, VIEW Engineering relocated to a facility in
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1985: VIEW 1220 β A 2nd generation, grayscale image, machine vision-based CMM
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A VIEW Machine Vision-based Automotive Shaft Measurement System, circa 2002.
761:"Robotic Vision Systems Inc Says It May Appeal in Patent Infringement Suit"
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1989: VIEW Ultra8 β A high-accuracy (sub-micron), machine vision-based CMM
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Using Multiple Cameras to Image a Package. (United States Patent 4872052)
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Dr. Richard Hubach demonstrating a VIEW 1101 Pattern Recognition System.
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805:"GSI Lumonics announces the sale of its Metrology Product Line to QVI"
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A VIEW Voyager 18x18 Machine Vision-based CMM with Microscope Optics.
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695:"Mitutoyo Company UK, Mitutoyo Worldwide, Section 9, 2nd Paragraph"
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1999: VIEW Pinnacle 250 β A high-accuracy, machine vision-based CMM
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1997: VIEW 890 β A laser-based, 3D scanner system for bump-on-die (
289:
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1987: VIEW PrΓ©cis 3000 β A large-travel, machine-vision-based CMM
717:"189 F3d 1370 Robotic Vision Systems Inc v VIEW Engineering Inc"
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VIEW 1220, PrΓ©cis 3000 & Bazic 8 Machine Vision-based CMMs.
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1995: VIEW 8100 β A laser-based, 3D scanner system for SMT (
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1986: VIEW 725 β A dedicated machine vision system for QFP (
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A VIEW 8100 SMT Process Characterization and Control System.
340:
651:"GM Corp acquires a minority stake in VIEW Engineering Inc"
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1988: VIEW Bazic8 & Bazic12 β Machine vision-based CMMs
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1982: VIEW 1200 β A binary image, machine vision-based CMM
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673:"VIEW Engineering Inc acquires Synthetic Vision Systems"
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783:"General Scanning Inc acquires VIEW Engineering Inc"
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1985: VIEW 720 β A 2nd generation, general-purpose,
958:"VIEW Engineering Assignee Patent Directory Page 4"
936:"VIEW Engineering Assignee Patent Directory Page 3"
907:"VIEW Engineering Assignee Patent Directory Page 2"
858:"VIEW Engineering Assignee Patent Directory Page 1"
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1041:Technology companies based in Greater Los Angeles
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192:was one of the first manufacturers of commercial
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383:image, machine vision system for shop floor use
785:. Thomson Financial Mergers & Acquisitions
675:. Thomson Financial Mergers & Acquisitions
653:. Thomson Financial Mergers & Acquisitions
739:"Court Decides on Machine Vision Patent Suit"
462:The timeline given above is summarized here.
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1056:Manufacturing companies established in 1976
1036:Manufacturing companies based in California
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357:1977: VIEW RB-1 β An automated, 3-axis,
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430:) process characterization and control
99:Renamed to VIEW Micro-Metrology (2008)
741:. Society of Manufacturing Engineers
629:"VIEW Engineering, Inc, Simi Valley"
60:Precision assembly & fabrication
558:"VIEW Micro-Metrology Applications"
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232:VIEW Engineering's Logo, circa 1996
224:VIEW Engineering's Logo, circa 1976
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1026:Commercial computer vision systems
167:Quality Vision International, Inc.
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1061:1976 establishments in California
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607:"History of VIEW Micro-Metrology"
580:"VIEW Ugly Duckling PDF Document"
415:1994: VIEW 830 β A laser-based,
243:VIEW Engineering was founded in
236:While working as a physicist at
198:Semiconductor device fabrication
45:Semiconductor device fabrication
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1031:Instrument-making corporations
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249:Coordinate-measuring machines
151:Coordinate-measuring machines
536:"About VIEW Micro-Metrology"
202:Integrated circuit packaging
155:Automated optical inspection
49:Integrated circuit packaging
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395:Plastic leaded chip carrier
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278:General Motors Corporation
270:in late 1977 and again to
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71:(March 9, 1976
272:Simi Valley, California
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245:Canoga Park, California
238:Hughes Aircraft Company
69:Canoga Park, California
982:. VIEW Micro-Metrology
882:. VIEW Micro-Metrology
829:. VIEW Micro-Metrology
827:"VIEW Micro-Metrology"
609:. VIEW Micro-Metrology
582:. VIEW Micro-Metrology
560:. VIEW Micro-Metrology
538:. VIEW Micro-Metrology
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210:Computer data storage
206:Printed circuit board
57:Computer data storage
53:Printed circuit board
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435:Thin Quad Flat Pack
123:Number of locations
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87:Dr. Richard Hubach
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960:. Patentmaps
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807:. PRNewswire
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452:) inspection
393:) and PLCC (
359:binary image
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263:β the PR-1.
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189:
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104:Headquarters
91:Veeder South
31:Company type
441:) and BGA (
257:Wirebonding
133:Area served
1020:Categories
631:. Techspex
517:References
445:) packages
417:3D scanner
89:Jack Sacks
75:1976-03-09
450:Flip chip
437:), TSOP (
381:grayscale
274:in 1981.
137:Worldwide
491:1293232)
290:Mitutoyo
142:Products
41:Industry
986:10 July
964:10 July
942:10 July
913:10 July
886:10 July
864:10 July
767:14 July
745:14 July
723:14 July
701:13 July
586:12 July
466:Patents
216:History
179:.viewmm
172:Website
157:systems
148:systems
84:Founder
73: (
65:Founded
35:Private
833:7 July
811:7 July
789:7 July
679:7 July
657:7 July
635:7 July
613:9 July
564:7 July
542:7 July
163:Parent
988:2011
966:2011
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703:2011
681:2011
659:2011
637:2011
615:2011
588:2011
566:2011
544:2011
288:for
181:.com
96:Fate
286:OEM
177:www
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