31:
588:(LXI) Standard defines the communication protocols for instrumentation and data acquisition systems using Ethernet. These systems are based on small, modular instruments, using low-cost, open-standard LAN (Ethernet). LXI-compliant instruments offer the size and integration advantages of modular instruments without the cost and form factor constraints of card-cage architectures. Through the use of Ethernet communications, the LXI Standard allows for flexible packaging, high-speed I/O, and standardized use of LAN connectivity in a broad range of commercial, industrial, aerospace, and military applications. Every LXI-compliant instrument includes an Interchangeable Virtual Instrument (IVI) driver to simplify communication with non-LXI instruments, so LXI-compliant devices can communicate with devices that are not themselves LXI compliant (i.e., instruments that employ GPIB, VXI, PXI, etc.). This simplifies building and operating hybrid configurations of instruments.
605:
64-bit data transfers and addressing. VME64 features include asynchronous data transfers, an addressing range between 16 and 40 bits, data path widths between 8 and 64 bits, and a bandwidth of 80 Mbit/s. VME64 extended (VME64x) is an improved version of the original VMEbus that features a 160-pin connector family, 3.3 V power supply pins, bandwidths up to 160 Mbit/s, injector/ejector locking handles, and hot swap capability. VME160 transfers data at 160 Mbit/s. VME320 transfers data at a rate of 320 Mbit/s. VXI combines VMEbus specifications with features from the general-purpose interface bus (GPIB) to meet the needs of instrumentation applications. VME, VPX and VXI bus interfaces and adapters for VPX applications are also available.
547:) standard parallel interface used for attaching sensors and programmable instruments to a computer. GPIB is a digital 8-bit parallel communications interface capable of achieving data transfers of more than 8 Mbytes/s. It allows daisy-chaining up to 14 instruments to a system controller using a 24-pin connector. It is one of the most common I/O interfaces present in instruments and is designed specifically for instrument control applications. The IEEE-488 specifications standardized this bus and defined its electrical, mechanical, and functional specifications, while also defining its basic software communication rules. GPIB works best for applications in industrial settings that require a rugged connection for instrument control.
551:
between instruments and controllers from various vendors. In 1975, the IEEE published ANSI/IEEE Standard 488–1975, IEEE Standard
Digital Interface for Programmable Instrumentation, which contained the electrical, mechanical, and functional specifications of an interfacing system. This standard was subsequently revised in 1978 (IEEE-488.1) and 1990 (IEEE-488.2). The IEEE 488.2 specification includes the Standard Commands for Programmable Instrumentation (SCPI), which define specific commands that each instrument class must obey. SCPI ensures compatibility and configurability among these instruments.
408:
203:
643:
widely used in building industrial test and measurement systems for several reasons (e.g., USB cables are rarely industrial grade, are noise sensitive, are not positively attached and so are rather easily detachable, and the maximum distance between the controller and device is limited to a few meters). Like some other connections, USB is primarily used for applications in a laboratory setting that do not require a rugged bus connection.
669:
and automation solution, with the master unit controlling sourcing, measuring, pass/fail decisions, test sequence flow control, binning, and the component handler or prober. Support for dedicated trigger lines means that synchronous operations between multiple instruments equipped with onboard Test Script
Processors that are linked by this high-speed bus can be achieved without the need for additional trigger connections.
449:
336:
116:
592:
instruments, and LXI offers features that both enable and enhance scripting. Although the current LXI standards for instrumentation do not require that instruments be programmable or implement scripting, several features in the LXI specification anticipate programmable instruments and provide useful functionality that enhances scripting's capabilities on LXI-compliant instruments.
516:
642:
bus that can handle up to 127 devices on one port, and has a theoretical maximum throughput of 480 Mbit/s (high-speed USB defined by the USB 2.0 specification). Because USB ports are standard features of PCs, they are a natural evolution of conventional serial port technology. However, it is not
651:
RS-232 is a specification for serial communication that is popular in analytical and scientific instruments, as well for controlling peripherals such as printers. Unlike GPIB, with the RS-232 interface, it is possible to connect and control only one device at a time. RS-232 is also a relatively slow
600:
VME eXtensions for
Instrumentation (VXI) are an electrical and mechanical standard used mainly with automatic test equipment (ATE). VXI allows equipment from different vendors to work together in a common control and packaging environment. VPX (a.k.a. VITA 46) is an ANSI standard based on the VMEbus
681:
to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well
660:
One of the most recently developed test system platforms employs instrumentation equipped with onboard test script processors combined with a high-speed bus. In this approach, one “master” instrument runs a test script (a small program) that controls the operation of the various “slave” instruments
604:
Selecting VME, VPX and VXI bus interfaces and adapters requires an analysis of available technologies. The original VME bus (VMEbus) uses
Eurocards, rugged circuit boards that provide a 96-pin plug instead of an edge connector for durability. VME64 is an expanded version of the VMEbus that provides
668:
The advantage of this platform is that all connected instruments behave as one tightly integrated multi-channel system, so users can scale their test system to fit their required channel counts cost-effectively. A system configured on this type of platform can stand alone as a complete measurement
601:
with support for switched fabric using a high speed connector. VXI combines VMEbus specifications with features from the general-purpose interface bus (GPIB) to meet the needs of instrumentation applications. Other technologies for VME, VPX and VXI controllers and processors may also be available.
550:
The original GPIB standard was developed in the late 1960s by
Hewlett-Packard to connect and control the programmable instruments the company manufactured. The introduction of digital controllers and programmable test equipment created a need for a standard, high-speed interface for communication
591:
LXI instruments sometimes employ scripting using embedded test script processors for configuring test and measurement applications. Script-based instruments provide architectural flexibility, improved performance, and lower cost for many applications. Scripting enhances the benefits of LXI
526:
Several modular electronic instrumentation platforms are currently in common use for configuring automated electronic test and measurement systems. These systems are widely employed for incoming inspection, quality assurance, and production testing of electronic devices and subassemblies.
625:
form factors and adds trigger lines, a local bus, and other functions suited for measurement applications. PXI hardware and software specifications are developed and maintained by the PXI Systems
Alliance. More than 50 manufacturers around the world produce PXI hardware.
664:
This approach is optimized for small message transfers that are characteristic of test and measurement applications. With very little network overhead and a 100 Mbit/s data rate, it is significantly faster than GPIB and 100BaseT Ethernet in real applications.
339:
A multimeter with a built in clamp facility. Pushing the large button at the bottom opens the lower jaw of the clamp, allowing the clamp to be placed around a conductor (wire). Depending on sensor, some can measure both AC and DC
661:
in the test system, to which it is linked via a high-speed LAN-based trigger synchronization and inter-unit communication bus. Scripting is writing programs in a scripting language to coordinate a sequence of actions.
554:
The IEEE-488 bus has long been popular because it is simple to use and takes advantage of a large selection of programmable instruments and stimuli. Large systems, however, have the following limitations:
568:
limits the controller-device distance to two meters per device or 20 meters total, whichever is less. This imposes transmission problems on systems spread out in a room or on systems that require remote
80:(DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
30:
762:
652:
interface with typical data rates of less than 20 kB/s. RS-232 is best suited for laboratory applications compatible with a slower, less rugged connection.
691:
419:
usually distinguished by frequency range (e.g., audio or radio frequencies) or waveform type (e.g., sine, square, sawtooth, ramp, sweep, modulated, ...)
575:
limit the system to 30 devices with primary addresses. Modern instruments rarely use secondary addresses so this puts a 30-device limit on system size.
87:
engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a
442:
50:
749:
98:
Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when
822:
617:), is a peripheral bus specialized for data acquisition and real-time control systems. Introduced in 1997, PXI uses the CompactPCI
17:
531:” or chassis-/mainframe-based systems, often under the control of a custom software application running on an external PC.
872:
585:
847:
785:
805:
126:
The following items are used for basic measurement of voltages, currents, and components in the circuit under test.
699:, a colloquial term applied to the process of systematically varying the impedance presented to a device under test
482:
842:
396:
432:
390:
191:
46:
678:
92:
716:
527:
Industry-standard communication interfaces link signal sources with measurement instruments in “
91:
consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as
384:
422:
307:
279:
158:
144:
519:
506:(SMU), a test tool capable to supply power and measure voltage or current at the same time.
387:(VSA) (Like the SA but it can also perform many more useful digital demodulation functions)
8:
503:
167:
e.g., VOM (Volt-Ohm-Milliammeter) or DMM (Digital
Multimeter) (Measures all of the above)
427:
259:
66:
493:
467:
378:
372:
285:
275:
227:
77:
416:
186:
809:
789:
462:
437:
407:
366:
323:
196:
99:
95:(ATE). ATE often includes many of these instruments in real and simulated forms.
58:
638:) connects peripheral devices, such as keyboards and mice, to PCs. The USB is a
639:
362:
173:- inductance (L), capacitance (C) and resistance (R) meter (measure LCR values)
866:
350:
782:
736:
528:
477:
472:
319:
221:
181:
154:
42:
38:
802:
515:
498:
303:
289:
269:
202:
84:
488:
299:
242:
211:
164:
88:
54:
696:
655:
622:
618:
313:
295:
231:
170:
130:
34:
853:
345:
140:
119:
857:
150:
134:
76:
is used to create signals and capture responses from electronic
448:
381:(Tests functionality, performance and conformance of protocols)
177:
The following are used for stimulus of the circuit under test:
837:
217:
The following analyze the response of the circuit under test:
335:
115:
763:"VME, VPX, and VXI Bus Interfaces and Adapters Information"
562:
capacity limits the system to 14 devices plus a controller.
544:
540:
248:
62:
485:(used to characterize an electrical network of components)
848:
ICS Electronics. “GPIB 101A Tutorial About the GPIB Bus.”
635:
614:
65:
frequency standard receiver with phase comparator, and
692:
List of electrical and electronic measuring equipment
608:
595:
579:
322:(Measures voltages, sometimes even tiny ones, via a
49:
plug-ins. Lower module is a mainframe of the series
682:as the switching hardware form factors available.
656:Test script processors and a channel expansion bus
748:Franklin, Paul and Todd A. Hayes. LXI Connection.
545:Institute of Electrical and Electronics Engineers
122:commercial digital voltmeter checking a prototype
864:
823:Smart Instruments Keep Up With Changing RD Needs
543:) is an IEEE-488 (a standard created by the
402:
672:
411:Leader Instruments LSG-15 signal generator.
375:(SA) (Measures spectral energy of signals)
224:(Displays voltage as it changes over time)
105:
27:Testing appliance for electronics systems
514:
456:
447:
406:
334:
249:Advanced or less commonly used equipment
201:
114:
102:existing production units in the field.
29:
629:
316:(Measures Electric and Magnetic Fields)
14:
865:
752:July 2008. Retrieved January 5, 2010.
613:PCI eXtensions for Instrumentation, (
539:The General Purpose Interface Bus (
24:
609:PCI eXtensions for Instrumentation
596:VME eXtensions for Instrumentation
580:LAN eXtensions for Instrumentation
110:
25:
884:
831:
534:
393:(Tests integrity of long cables)
238:And connecting it all together:
850:, Retrieved December 29, 2009.
821:Cigoy, Dale. R&D Magazine.
815:
795:
792:. Retrieved December 30, 2009.
775:
755:
750:Benefits of LXI and Scripting.
742:
729:
709:
13:
1:
703:
677:The addition of a high-speed
812:Retrieved December 30, 2009.
739:Retrieved December 29, 2009.
510:
356:
7:
858:United Testing Systems Inc.
685:
10:
889:
825:Retrieved January 4, 2009.
634:The Universal Serial Bus (
397:Semiconductor curve tracer
157:or Milliammeter (Measures
873:Electronic test equipment
717:"Signal Injector Circuit"
646:
433:Digital pattern generator
403:Signal-generating devices
391:Time-domain reflectometer
330:
310:and combinations thereof)
192:Digital pattern generator
74:Electronic test equipment
47:time-domain reflectometer
673:Test equipment switching
93:automatic test equipment
106:Types of test equipment
801:PXI Systems Alliance.
781:PXI Systems Alliance.
737:Extending the GPIB Bus
523:
453:
412:
385:Vector signal analyzer
341:
214:
123:
70:
18:Test & Measurement
518:
457:Miscellaneous devices
451:
423:Frequency synthesiser
410:
338:
205:
118:
33:
843:NIST’s 1588 Standard
630:Universal Serial Bus
520:Keithley Instruments
278:(Precisely measures
272:(current transducer)
504:Source measure unit
808:2010-09-05 at the
788:2010-09-02 at the
524:
454:
428:Function generator
413:
342:
260:Solenoid voltmeter
215:
124:
78:devices under test
71:
67:function generator
735:ICS Electronics.
573:Primary addresses
494:Transistor tester
468:Continuity tester
379:Protocol analyzer
373:Spectrum analyzer
286:Capacitance meter
276:Wheatstone bridge
228:Frequency counter
55:digital voltmeter
16:(Redirected from
880:
826:
819:
813:
799:
793:
779:
773:
772:
770:
769:
759:
753:
746:
740:
733:
727:
726:
724:
723:
713:
679:switching system
483:Network analyzer
417:Signal generator
367:digital circuits
187:Signal generator
21:
888:
887:
883:
882:
881:
879:
878:
877:
863:
862:
834:
829:
820:
816:
810:Wayback Machine
800:
796:
790:Wayback Machine
780:
776:
767:
765:
761:
760:
756:
747:
743:
734:
730:
721:
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688:
675:
658:
649:
632:
611:
598:
582:
537:
522:Series 4200 CVU
513:
463:Boxcar averager
459:
443:Signal injector
438:Pulse generator
405:
359:
333:
251:
197:Pulse generator
113:
111:Basic equipment
108:
100:troubleshooting
59:digital counter
51:Tektronix TM500
28:
23:
22:
15:
12:
11:
5:
886:
876:
875:
861:
860:
855:
851:
845:
840:
838:LXI Consortium
833:
832:External links
830:
828:
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814:
803:Specifications
794:
783:Specifications
774:
754:
741:
728:
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529:rack-and-stack
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363:Logic analyzer
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182:Power supplies
175:
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148:
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112:
109:
107:
104:
26:
9:
6:
4:
3:
2:
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641:
640:Plug and Play
637:
627:
624:
620:
616:
606:
602:
593:
589:
587:
574:
571:
569:measurements.
567:
564:
561:
560:Driver fanout
558:
557:
556:
552:
548:
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542:
535:GPIB/IEEE-488
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351:Signal tracer
349:
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68:
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60:
56:
52:
48:
44:
40:
36:
32:
19:
817:
797:
777:
766:. Retrieved
757:
744:
731:
720:. Retrieved
711:
676:
667:
663:
659:
650:
633:
612:
603:
599:
590:
583:
572:
566:Cable length
565:
559:
553:
549:
538:
525:
478:Hipot tester
473:Cable tester
452:Cable tester
320:Electrometer
263:
253:
252:
237:
222:Oscilloscope
216:
207:
176:
155:Galvanometer
125:
97:
82:
73:
72:
43:curve tracer
39:oscilloscope
499:Tube tester
304:capacitance
290:capacitance
270:Clamp meter
243:Test probes
85:electronics
768:2021-06-03
722:2018-06-03
704:References
489:Test light
308:resistance
300:inductance
298:(Measures
288:(Measures
280:resistance
230:(Measures
212:multimeter
206:Voltcraft
165:Multimeter
145:resistance
143:(Measures
133:(Measures
89:test light
83:Practical
53:and has a
697:Load pull
511:Platforms
357:Analyzers
314:EMF Meter
296:LCR meter
232:frequency
210:portable
171:LCR meter
131:Voltmeter
61:, an old
35:Tektronix
867:Category
806:Archived
786:Archived
686:See also
346:RF probe
340:current.
141:Ohmmeter
120:Keysight
365:(Tests
326:effect)
159:current
153:, e.g.
151:Ammeter
135:voltage
647:RS-232
331:Probes
324:charge
254:Meters
208:M-3850
264:Wiggy
41:with
37:7854
621:and
584:The
541:GPIB
63:WWVB
57:, a
45:and
636:USB
615:PXI
586:LXI
869::
623:6U
619:3U
306:,
302:,
771:.
725:.
369:)
292:)
282:)
266:)
262:(
234:)
161:)
147:)
137:)
69:.
20:)
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