630:) standard parallel interface used for attaching sensors and programmable instruments to a computer. GPIB is a digital 8-bit parallel communications interface capable of achieving data transfers of more than 8 MB/s. It allows daisy-chaining up to 14 instruments to a system controller using a 24-pin connector. It is one of the most common I/O interfaces present in instruments and is designed specifically for instrument control applications. The IEEE-488 specifications standardized this bus and defined its electrical, mechanical, and functional specifications, while also defining its basic software communication rules. GPIB works best for applications in industrial settings that require a rugged connection for instrument control.
672:
without the cost and form factor constraints of card-cage architectures. Through the use of
Ethernet communications, the LXI Standard allows for flexible packaging, high-speed I/O, and standardized use of LAN connectivity in a broad range of commercial, industrial, aerospace, and military applications. Every LXI-compliant instrument includes an Interchangeable Virtual Instrument (IVI) driver to simplify communication with non-LXI instruments, so LXI-compliant devices can communicate with devices that are not themselves LXI compliant (i.e., instruments that employ GPIB, VXI, PXI, etc.). This simplifies building and operating hybrid configurations of instruments.
634:
between instruments and controllers from various vendors. In 1975, the IEEE published ANSI/IEEE Standard 488-1975, IEEE Standard
Digital Interface for Programmable Instrumentation, which contained the electrical, mechanical, and functional specifications of an interfacing system. This standard was subsequently revised in 1978 (IEEE-488.1) and 1990 (IEEE-488.2). The IEEE 488.2 specification includes the Standard Commands for Programmable Instrumentation (SCPI), which define specific commands that each instrument class must obey. SCPI ensures compatibility and configurability among these instruments.
439:, may not be used in many ATEs due to the limited number of measurements the instrument could make, and the time it would take to use the instruments to make the measurement. One key advantage to using DSP to measure the parameters is time. If we have to calculate the peak voltage of an electrical signal and other parameters of the signal, then we have to employ a peak detector instrument as well as other instruments to test the other parameters. If DSP-based instruments are used, however, then a sample of the signal is made and the other parameters can be computed from the single measurement.
413:
semiconductor ATEs include multiple computer-controlled instruments to source or measure a wide range of parameters. The instruments may include device power supplies (DPS), parametric measurement units (PMU), arbitrary waveform generators (AWG), digitizers, digital IOs, and utility supplies. The instruments perform different measurements on the DUT, and the instruments are synchronized so that they source and measure waveforms at the proper times. Based on the requirement of response-time, real-time systems are also considered for stimulation and signal capturing.
223:
66:
692:. Introduced in 1987, VXI uses all Eurocard form factors and adds trigger lines, a local bus, and other functions suited for measurement applications. VXI systems are based on a mainframe or chassis with up to 13 slots into which various VXI instrument modules can be installed. The chassis also provides all the power supply and cooling requirements for the chassis and the instruments it contains. VXI bus modules are typically
774:
and automation solution, with the master unit controlling sourcing, measuring, pass/fail decisions, test sequence flow control, binning, and the component handler or prober. Support for dedicated trigger lines means that synchronous operations between multiple instruments equipped with onboard Test Script
Processors that are linked by this high speed bus can be achieved without the need for additional trigger connections.
25:
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instruments, and LXI offers features that both enable and enhance scripting. Although the current LXI standards for instrumentation do not require that instruments be programmable or implement scripting, several features in the LXI specification anticipate programmable instruments and provide useful functionality that enhances scripting's capabilities on LXI-compliant instruments.
283:
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deciding on the parameters to be tested is a complex decision based on cost vs yield. If the device is a complex digital device, with thousands of gates, then test fault coverage has to be calculated. Here again, the decision is complex based on test economics, based on frequency, number and type of I/Os in the device and the end-use application...
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bus that can handle up to 127 devices on one port, and has a theoretical maximum throughput of 480 Mbit/s (high-speed USB defined by the USB 2.0 specification). Because USB ports are standard features of PCs, they are a natural evolution of conventional serial port technology. However, it is not
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Standard defines the communication protocols for instrumentation and data acquisition systems using
Ethernet. These systems are based on small, modular instruments, using low-cost, open-standard LAN (Ethernet). LXI-compliant instruments offer the size and integration advantages of modular instruments
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RS-232 is a specification for serial communication that is popular in analytical and scientific instruments, as well for controlling peripherals such as printers. Unlike GPIB, with the RS-232 interface, it is possible to connect and control only one device at a time. RS-232 is also a relatively slow
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One of the most recently developed test system platforms employs instrumentation equipped with onboard test script processors combined with a high-speed bus. In this approach, one "master" instrument runs a test script (a small program) that controls the operation of the various "slave" instruments
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to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well
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ATE systems typically interface with an automated placement tool, called a "handler", that physically places the Device Under Test (DUT) on an
Interface Test Adapter (ITA) so that it can be measured by the equipment. There may also be an Interface Test Adapter (ITA), a device just making electronic
773:
The advantage of this platform is that all connected instruments behave as one tightly integrated multi-channel system, so users can scale their test system to fit their required channel counts cost-effectively. A system configured on this type of platform can stand alone as a complete measurement
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Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.
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can be implemented as a PCB-level or system-level interface bus for the purpose of controlling the pins of an IC and facilitating continuity (interconnection) tests on a test target (UUT) and also functional cluster tests on logic devices or groups of devices. It can also be used as a controlling
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The original GPIB standard was developed in the late 1960s by
Hewlett-Packard to connect and control the programmable instruments the company manufactured. The introduction of digital controllers and programmable test equipment created a need for a standard, high-speed interface for communication
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are used. ATE systems are designed to reduce the amount of test time needed to verify that a particular device works or to quickly find its faults before the part has a chance to be used in a final consumer product. To reduce manufacturing costs and improve yield, semiconductor devices should be
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But testing the device for all parameters may or may not be required depending on the device functionality and end user. For example, if the device finds application in medical or life-saving products then many of its parameters must be tested, and some of the parameters must be guaranteed. But
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For example, to measure a voltage of a particular semiconductor device, the
Digital Signal Processing (DSP) instruments in the ATE measure the voltage directly and send the results to a computer for signal processing, where the desired value is computed. This example shows that conventional
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LXI instruments sometimes employ scripting using embedded test script processors for configuring test and measurement applications. Script-based instruments provide architectural flexibility, improved performance, and lower cost for many applications. Scripting enhances the benefits of LXI
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Several modular electronic instrumentation platforms are currently in common use for configuring automated electronic test and measurement systems. These systems are widely employed for incoming inspection, quality assurance, and production testing of electronic devices and subassemblies.
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is a normal desktop computer packaged in 19-inch rack standards with sufficient PCI / PCIe slots for accommodating the Signal stimulator/sensing cards. This takes up the role of a controller in the ATE. Development of test applications and result storage is managed in this PC. Most modern
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widely used in building industrial test and measurement systems for a number of reasons; for example, USB cables are not industrial grade, are noise sensitive, can accidentally become detached, and the maximum distance between the controller and the device is 30 m. Like
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form factors and adds trigger lines, a local bus, and other functions suited for measurement applications. PXI hardware and software specifications are developed and maintained by the PXI Systems
Alliance. More than 50 manufacturers around the world produce PXI hardware.
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This approach is optimized for small message transfers that are characteristic of test and measurement applications. With very little network overhead and a 100 Mbit/sec data rate, it is significantly faster than GPIB and 100BaseT Ethernet in real applications.
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One way to improve test time is to test multiple devices at once. ATE systems can now support having multiple "sites" where the ATE resources are shared by each site. Some resources can be used in parallel, others must be serialized to each DUT.
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connections between the ATE and the Device Under Test (also called Unit Under Test or UUT), but also it might contain an additional circuitry to adapt signals between the ATE and the DUT and has physical facilities to mount the DUT. Finally, a
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The diagnostic portion can be the most difficult and costly portion of the test. It is typical for ATE to reduce a failure to a cluster or ambiguity group of components. One method to help reduce these ambiguity groups is the addition of
464:. Packaged parts use a handler to place the device on a customized interface board, whereas silicon wafers are tested directly with high precision probes. The ATE systems interact with the handler or prober to test the DUT.
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in the test system, to which it is linked via a high-speed LAN-based trigger synchronization and inter-unit communication bus. Scripting is writing programs in a scripting language to coordinate a sequence of actions.
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is a connector interface between test instruments (PXI, VXI, LXI, GPIB, SCXI, & PCI) and devices/units under test (D/UUT). This section acts as a nodal point for signals going in/out between ATE and D/UUT.
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Not all devices are tested equally. Testing adds costs, so low-cost components are rarely tested completely, whereas medical or high costs components (where reliability is important) are frequently tested.
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The IEEE-488 bus has long been popular because it is simple to use and takes advantage of a large selection of programmable instruments and stimuli. Large systems, however, have the following limitations:
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limits the controller-device distance to two meters per device or 20 meters total, whichever is less. This imposes transmission problems on systems spread out in a room or on systems that require remote
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interface with typical data rates of less than 20 KB/s. RS-232 is best suited for laboratory applications compatible with a slower, less rugged connection. It works on a ±24 volt supply.
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is used to bridge the connection between the ITA and the DUT. A socket must survive the rigorous demands of a production floor, so they are usually replaced frequently.
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interface for other instrumentation that can be embedded into the ICs themselves (see IEEE 1687) or instruments that are part of an external controllable test system.
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limit the system to 30 devices with primary addresses. Modern instruments rarely use secondary addresses so this puts a 30 device limit on system size.
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ATE is widely used in the electronic manufacturing industry to test electronic components and systems after being fabricated. ATE is also used to test
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were used by ATE systems. The Device Under Test (DUT) is physically connected to the ATE by another robotic machine called a handler or
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is a peripheral bus specialized for data acquisition and real-time control systems. Introduced in 1997, PXI uses the
CompactPCI
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392:) that synchronizes one or more source and capture instruments (listed below). Historically, custom-designed controllers or
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and the electronic modules in automobiles. It is used in military applications like radar and wireless communication.
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and through a customized
Interface Test Adapter (ITA) or "fixture" that adapts the ATE's resources to the DUT.
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to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled
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Industry-standard communication interfaces link signal sources with measurement instruments in "
548:(ATLAS). Automatic test equipment can also be automated using a test execution engine such as
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540:) with additional statements to control the ATE equipment through standard and proprietary
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tested after being fabricated to prevent defective devices ending up with the consumer.
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Apparatus used in hardware testing that carries out a series of tests automatically
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bus architecture is an open standard platform for automated test based on the
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The semiconductor ATE architecture consists of master controller (usually a
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connects peripheral devices, such as keyboards and mice, to PCs. USB is a
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Simple electrical interface diagram: ATE → ITA → DUT (package) ← Handler
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ATE can be used on packaged parts (typical IC 'chip') or directly on the
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List of books covering automatic test systems and applications (archive)
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Many ATE platforms used in the semiconductor industry output data using
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testing to the ATE system. Diagnostics are often aided by the use of
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Hardware Mechanical Components VXI Chassis and Case Manufacturers
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An Engineer's Guide to Automated Testing of High-Speed Interfaces
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304:) is any apparatus that performs tests on a device, known as the
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System Integration of an Open-Architecture Test System (archive)
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Simple electrical interface diagram: ATE → Prober → Wafer (DUT)
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capacity limits the system to 14 devices plus a controller.
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544:(API). Also some dedicated computer languages exist, like
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The ATE computer uses modern computer languages (like
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that moves across a silicon wafer to test the device.
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may be too technical for most readers to understand
90:. Unsourced material may be challenged and removed.
1034:Impact of Cable Losses in Automatic Tester Systems
761:Test script processors and a channel expansion bus
601:as the switching hardware form factors available.
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948:Franklin, Paul and Todd A. Hayes. LXI Connection.
628:Institute of Electrical and Electronics Engineers
488:Wafer-based ATEs typically use a device called a
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1008:Smart Instruments Keep Up With Changing RD Needs
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1039:GPIB 101A Tutorial About the GPIB Bus (archive)
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626:) is an IEEE-488 (a standard created by the
559:is used to help design the series of tests.
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53:Learn how and when to remove these messages
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546:Abbreviated Test Language for All Systems
456:Handler or prober and device test adapter
270:Learn how and when to remove this message
205:Learn how and when to remove this message
189:, without removing the technical details.
150:Learn how and when to remove this message
700:PCI eXtensions for Instrumentation (PXI)
680:VME eXtensions for Instrumentation (VXI)
663:LAN eXtensions for Instrumentation (LXI)
443:Test parameter requirements vs test time
281:
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884:Demystifying Mixed Signal Test Methods
844:Jose Moreira, Hubert Werkmann (2010).
952:July 2008. Retrieved January 5, 2010.
351:Semiconductor ATE, named for testing
187:make it understandable to non-experts
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88:adding citations to reliable sources
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622:The General Purpose Interface Bus (
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430:Example: Simple voltage measurement
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799:LAN eXtensions for Instrumentation
542:application programming interfaces
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34:This article has multiple issues.
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75:needs additional citations for
42:or discuss these issues on the
1006:Cigoy, Dale. R&D Magazine.
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977:. Retrieved December 30, 2009.
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950:Benefits of LXI and Scripting.
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484:Silicon wafer ATE with probers
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596:The addition of a high-speed
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347:In the semiconductor industry
1028:ATE Automatic Testing Basics
997:Retrieved December 30, 2009.
939:Retrieved December 29, 2009.
7:
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234:to comply with Knowledge's
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1010:Retrieved January 4, 2009.
881:Mark Baker (3 June 2003).
720:Universal Serial Bus (USB)
99:"Automatic test equipment"
1069:Electronic test equipment
785:Electronic test equipment
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582:analog signature analysis
569:Standard Test Data Format
318:electronic test equipment
1059:Automatic test equipment
605:Test equipment platforms
592:Test equipment switching
298:automated test equipment
294:Automatic test equipment
247:may contain suggestions.
232:may need to be rewritten
1074:Nondestructive testing
986:PXI Systems Alliance.
973:PXI Systems Alliance.
937:Extending the GPIB Bus
373:printed circuit boards
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816:(testing of software)
435:instruments, like an
353:semiconductor devices
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923:National Instruments
919:"What is TestStand?"
287:Keithley Instruments
84:improve this article
369:integrated circuits
334:integrated circuits
993:2010-09-05 at the
314:digital multimeter
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935:ICS Electronics.
656:Primary addresses
423:mass interconnect
417:Mass interconnect
306:device under test
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82:Please help
77:verification
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36:Please help
33:
696:in height.
575:Diagnostics
377:probe cards
1053:Categories
904:2015-10-12
867:2015-10-12
832:References
555:Sometimes
499:Multi-site
384:Components
361:capacitors
310:automation
253:April 2024
195:April 2024
140:April 2024
110:newspapers
39:improve it
588:testing.
538:Smalltalk
365:inductors
357:resistors
245:talk page
45:talk page
991:Archived
889:Elsevier
804:M-Module
794:IEEE-488
778:See also
390:computer
341:avionics
571:(STDF)
534:LabVIEW
437:ammeter
371:(ICs),
181:Please
124:scholar
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858:
820:VMEbus
740:RS-232
734:RS-232
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